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???????? - Columbia FDI Perspectives
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Probe Card Cleaning Sheet SWE Type
Test Probe acts as the contact interface between the Device Under Test (DUT) and the tester, forming a connection for electrical and functional testing by ...
Clean Pad for Test Socket and Wafer Probe Cards - TestConX
This paper presents a solution to these problems, allowing a probe card to contact TSVs without the need for probe pads, enabling both TSV and pre-bond scan ...