Probe Selection Guide - MB Electronique
More than 50 different probe models for wafer, package and board level characterization. Page 2. Probe Selection Guide. ?Table of Contents.
MEMS Vertical Probe Cards With Ultra Densely Arrayed Metal ...Abstract?We have developed a MEMS probe-card technology for wafer-level testing ICs with 1-D line-arrayed or 2-D area- arrayed dense pads layouts. 40k Probes on 300mmProbe Card with 40k Probes - Results. ?Used in volume production. ? Stable and consistent Yield results. ?Other designs with similar probe count are currently ... Probe CardAn EEPROM device attached to each probe card lets the tester identify individual cards and count probe touchdowns. It's simple to track each card independently ...
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