IEEE ELECTRON DEVICES SOCIETY
Ill-Nitride, SiC, and diamond materials for electronic devices : symposium held April 8-12, 1996, San Francisco, California, U.S.A. / editors,.
Materials for Electronic Devices - DTICLow-Field Amorphous State Resistance and Threshold Voltage Drift in Chalcogenide Materials . ... T. D. Khoa and S. Horita. 820. A?Si:H-Based LCLV ... Call for ... Expansion and Sub-Classification of T Cell-Dependent Antibody ...Abstract. An interlaboratory study on the National Institute for Environmental Studies (NIES) certified reference material (CRM) No. 28. Intrapulmonary percussive ventilation via Mini-Trach II in critical careObjectives: The objective of this study was to evaluate the efficacy and safety of the sequential use of bedaquiline (Bdq) and delamanid (Dlm) in patients ...
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